SYSTEM AND METHOD FOR MEASURING NEAR FIELD INFORMATION OF DEVICE UNDER TEST

SYSTEM AND METHOD FOR MEASURING NEAR FIELD INFORMATION OF DEVICE UNDER TEST

A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling loc...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MIN KYUNG JIN, MUCHAIDZE GIORGI, CHIKHRADZE BESARION
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.