METHOD FOR DETERMINING DEVIATIONS BETWEEN COORDINATE SYSTEMS OF DIFFERENT TECHNICAL SYSTEMS

Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test featu...

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Bibliographische Detailangaben
Hauptverfasser:	ABRAHAM MARIO, AGETHEN JOHANNES, MATSCHNIGG JOACHIM, KLAFKE MARIO
Format:	Patent
Sprache:	eng
Schlagworte:	BANDAGES, DRESSINGS OR ABSORBENT PADS DEVICES PROVIDING PATENCY TO, OR PREVENTING COLLAPSING OF,TUBULAR STRUCTURES OF THE BODY, E.G. STENTS DIAGNOSIS FILTERS IMPLANTABLE INTO BLOOD VESSELS FIRST-AID KITS FOMENTATION HUMAN NECESSITIES HYGIENE IDENTIFICATION INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT MEASURING MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK MEDICAL OR VETERINARY SCIENCE ORTHOPAEDIC, NURSING OR CONTRACEPTIVE DEVICES PHYSICS PROSTHESES SURGERY TESTING TREATMENT OR PROTECTION OF EYES OR EARS
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Beschreibung
Zusammenfassung:	Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical system and (b) the coordinate position of the reference feature in the coordinate system (u,v) of the first technical system.