METHOD OF PATTERNED IMAGE REVERSAL

A method of forming a reverse image pattern on a semiconductor base layer is disclosed. The method comprises depositing a transfer layer of amorphous carbon on the semiconductor base layer, depositing a resist layer on the transfer layer, creating a first pattern in the resist layer, creating the fi...

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Bibliographische Detailangaben
Hauptverfasser:	SARDESAI VIRAJ YASHAWANT, BELYANSKY MICHAEL P, VENIGALLA RAJASEKHAR
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS SEMICONDUCTOR DEVICES SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING
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Beschreibung
Zusammenfassung:	A method of forming a reverse image pattern on a semiconductor base layer is disclosed. The method comprises depositing a transfer layer of amorphous carbon on the semiconductor base layer, depositing a resist layer on the transfer layer, creating a first pattern in the resist layer, creating the first pattern in the transfer layer, removing the resist layer, depositing a reverse mask layer, planarizing the reverse mask layer, and removing the transfer layer, thus forming a second pattern that is a reverse image of the first pattern.