Voltage Supply Droop Detector

A built-in self-test (BIST) circuit for detecting power supply droops is disclosed. In one embodiment, the BIST circuit includes a transition circuit configured to launch logical signals into a delay line. The BIST circuit also includes a comparator configured to compare a logic signal based on that input into the delay line with one output from the delay line. A mismatch resulting from the comparison is indicative of a power supply droop. The BIST circuit may also include circuitry for calibrating the delay line. The calibration may be performed by enabling a feedback path between the output of the delay line and its input. Enabling the feedback path may form a ring oscillator utilizing the delay line. A counter may count the number of transitions caused by the ring oscillator in a predetermined time. The resulting count may be used to determine if the delay is in a desired range.