TIP-MOUNTED NANOWIRE LIGHT SOURCE INSTRUMENTATION

TIP-MOUNTED NANOWIRE LIGHT SOURCE INSTRUMENTATION

A scanning probe microscopy instrument includes a cantilevered tip that has a nanowire light emitting diode (LED).

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Hauptverfasser: WALLIS THOMAS M, BERTNESS KRISTINE A, SANFORD NORMAN A, KABOS PAVEL
Format: Patent
Sprache:eng
Schlagworte:
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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creator WALLIS THOMAS M
BERTNESS KRISTINE A
SANFORD NORMAN A
KABOS PAVEL
description A scanning probe microscopy instrument includes a cantilevered tip that has a nanowire light emitting diode (LED).
format Patent
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title TIP-MOUNTED NANOWIRE LIGHT SOURCE INSTRUMENTATION
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