METHODS AND SYSTEMS FOR MONITORING COMPONENTS USING A MICROWAVE EMITTER

A method for measuring a proximity of a component with respect to a microwave emitter is provided. The method comprises transmitting at least one microwave signal to the microwave emitter. At least one electromagnetic field is generated by the microwave emitter from the microwave signal. Moreover, t...

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Bibliographische Detailangaben
Hauptverfasser:	FRANCIS SAMUEL THOMAS WALTER, GO STEVEN YUEHIN, SHEIKMAN BORIS LEONID, FOLDEN DWAYNE ANDREW
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for measuring a proximity of a component with respect to a microwave emitter is provided. The method comprises transmitting at least one microwave signal to the microwave emitter. At least one electromagnetic field is generated by the microwave emitter from the microwave signal. Moreover, the method comprises inducing a loading to the microwave emitter by an interaction between the component and the electromagnetic field, wherein at least one detuned loading signal representative of the loading is reflected within a data conduit from the microwave emitter. The detuned loading signal is received by at least one signal processing device. The signal processing device then measures the proximity of the component with respect to the microwave emitter based on the loading signal. An electrical output is generated by the signal processing device.