CHARGED PARTICLE GUN AND CHARGED PARTICLE BEAM DEVICE

The present invention provides a charged particle gun including: a charged particle source (1); an extraction electrode (2); an opening (14) through which a charged particle beam passes; and a barrier provided in an area defined by connecting the charged particle source to the opening, the barrier s...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MURAKOSHI HISAYA, KOKUBO SHIGERU, CHO BOKLAE
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:The present invention provides a charged particle gun including: a charged particle source (1); an extraction electrode (2); an opening (14) through which a charged particle beam passes; and a barrier provided in an area defined by connecting the charged particle source to the opening, the barrier serving to prevent molecules existing in a downstream vacuum chamber from passing through the opening to adsorb onto the charged particle source. Accordingly, the molecules existing in the downstream lower-vacuum chamber can be prevented from adsorbing onto the charged particle source, so that current noise can be reduced. This enables stable operations of the charged particle beam gun and a charged particle beam device including the charged particle beam gun.