Methods and System for Electrostatic Discharge Protection of Thin-Film Transistor Backplane Arrays

The present invention provides devices and methods for testing the electrical performance of thin-film transistor backplane arrays and protecting thin-films during testing and handling.

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Bibliographische Detailangaben
Hauptverfasser:	VENUGOPAL SAMEER M, BAWOLEK EDWARD J, MOYER CURTIS D
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION BASIC ELECTRIC ELEMENTS CONVERSION OR DISTRIBUTION OF ELECTRIC POWER CRYPTOGRAPHY CURRENT COLLECTORS DISPLAY EDUCATION ELECTRICITY EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERATION LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEALS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	The present invention provides devices and methods for testing the electrical performance of thin-film transistor backplane arrays and protecting thin-films during testing and handling.