METHOD FOR RECORDING CRITICAL PATTERNS WITH DIFFERENT MARK LENGTHS ONTO OPTICAL STORAGE MEDIUM AND RELATED CONTROLLER THEREOF

An exemplary method for recording a first mark with a first length and a second mark with a second length onto an optical storage medium includes: when recording of the first mark requires a power transition from a first laser power level to a second laser power level, making a specific control sign...

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Hauptverfasser: CHANG YOU-WEN, CHAN YI-SUNG
Format: Patent
Sprache:eng
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Zusammenfassung:An exemplary method for recording a first mark with a first length and a second mark with a second length onto an optical storage medium includes: when recording of the first mark requires a power transition from a first laser power level to a second laser power level, making a specific control signal have a logic transition from a low logic value to a high logic value and other control signals have no logic transition; and when recording of the second mark requires a power transition from a third laser power level to a fourth laser power level, making the specific control signal have the logic transition from the low logic value to the high logic value and other control signals have no logic transition.