Apparatus, System, and Method for Direct Phase Probing and Mapping of Electromagnetic Signals

An apparatus, system, and method for phase detection of electromagnetic signals are presented. The apparatus may include a magnetic element, one or more first signal contacts coupled to the magnetic element for receiving a first signal, and one or more output contacts coupled to the magnetic element...

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Bibliographische Detailangaben
Hauptverfasser:	HU CAN-MING, FAN XIAOLONG, WIRTHMANN ANDRE, GUI YONGSHENG
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TOANOTHER ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	An apparatus, system, and method for phase detection of electromagnetic signals are presented. The apparatus may include a magnetic element, one or more first signal contacts coupled to the magnetic element for receiving a first signal, and one or more output contacts coupled to the magnetic element for providing a variable level voltage generated by the magnetic element, the level of the voltage being responsive to a phase difference between the first signal and a second signal. In a further embodiment, the apparatus may include a substrate for mechanically supporting the magnetic element. Additionally, the apparatus may include a conductor mechanically supported by substrate, the conductor configured to receive the second signal.