METHOD AND SYSTEM TO PREDICT A NUMBER OF ELECTROMIGRATION CRITICAL ELEMENTS

METHOD AND SYSTEM TO PREDICT A NUMBER OF ELECTROMIGRATION CRITICAL ELEMENTS

A method and system to predict a number of electromigration critical elements in semiconductor products. This method includes determining critical element factors for a plurality of library elements in a circuit design library using a design tool running on a computer device and based on at least on...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NETRABILE DILEEP N, MCLAUGHLIN PAUL S, HABITZ PETER A, LI BAOZHEN, BICKFORD JEANNE P
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:A method and system to predict a number of electromigration critical elements in semiconductor products. This method includes determining critical element factors for a plurality of library elements in a circuit design library using a design tool running on a computer device and based on at least one of an increased reliability temperature and an increased expected current. The method also includes determining a number of critical elements in a product based on: (i) numbers of respective ones of the plurality of library elements comprised in the product, and (ii) the critical element factors.