INTEGRATED CIRCUIT AND DIAGNOSIS CIRCUIT

A integrated circuit include: a first selection circuit selecting first data from input-data or scan-data, scan-data being for performing a diagnosis of a combinational circuit, input-data being received from a combinational circuit; a first latch circuit holding first data as first output-data in a...

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1. Verfasser: INAGAWA RYOICHI
Format: Patent
Sprache:eng
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Zusammenfassung:A integrated circuit include: a first selection circuit selecting first data from input-data or scan-data, scan-data being for performing a diagnosis of a combinational circuit, input-data being received from a combinational circuit; a first latch circuit holding first data as first output-data in accordance with a first signal; a second latch circuit holding first output-data as second output-data in accordance with which of the first signal and a second signal, the second signal being used to force the second latch circuit to hold first output-data; a third latch circuit holding first output-data as third output-data in accordance with which of the first signal and a third signal, the third signal being used to force the third latch circuit to hold first output-data; and a second selection circuit selecting second data from among the data which include second output-data and third output-data.