POWER SUPPLY AND SEMICONDUCTOR TEST DEVICE USING THE SAME

A negative polarity side of a positive-side parallel circuit and a positive polarity side of a negative-side parallel circuit are connected to a common potential point. Both parallel circuits have a primary-side power supply and a by-pass capacitor connected in parallel, respectively. A series circu...

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1. Verfasser: NARIKAWA KENICHI
Format: Patent
Sprache:eng
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Zusammenfassung:A negative polarity side of a positive-side parallel circuit and a positive polarity side of a negative-side parallel circuit are connected to a common potential point. Both parallel circuits have a primary-side power supply and a by-pass capacitor connected in parallel, respectively. A series circuit has one end connected to a positive polarity side of the positive-side parallel circuit and other end connected to a negative polarity side of the negative-side parallel circuit. A third switch has one end connected to a connection point between a first switch and a second switch of the series circuit and other end connected to the common potential point. A load has one end connected to a connection point of the first switch, the second switch and the third switch via an inductor and other end connected to the common potential point. A switch control circuit is configured to drive selectively respective switches.