DEVICE FOR MEASURING TEMPERATURE AND LEAKAGE CURRENT IN A CHIP

Device for measuring temperature and leakage current in a chip, which provides an output which linearly varies with the temperature. The device comprises a leakage inverter and an electronic module which digitalizes and linearizes the non-linear output of the leakage inverter. When providing a linear response, the need for storage and data interconnection is reduced, besides the numeric representation thereof is facilitated. The device can be used to measure temperature variations inside a chip and also to measure leakage current variations, which also entails measuring static power variations inside a chip.