DIFFERENTIAL SIGNAL PROBING SYSTEM
A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal |
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