Instrument Gauge And Pointer

A pointer for an instrument panel having an enlarged central display area substantially free from obstruction from the pointer as it rotates about an axis located within the central display area.

Bibliographische Detailangaben

Hauptverfasser:	GUIRAUTON PASCAL, CRAMER DALE O, BETTS STEPHEN LEE
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!