Instrument Gauge And Pointer

A pointer for an instrument panel having an enlarged central display area substantially free from obstruction from the pointer as it rotates about an axis located within the central display area.

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Bibliographische Detailangaben
Hauptverfasser:	GUIRAUTON PASCAL, CRAMER DALE O, BETTS STEPHEN LEE
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A pointer for an instrument panel having an enlarged central display area substantially free from obstruction from the pointer as it rotates about an axis located within the central display area.