Semiconductor wafer, semiconductor device using the same, and method and apparatus for producing the same

A method of processing a semiconductor wafer includes preheating the wafer to a preheating temperature that is less than a peak temperature, heating the wafer from the preheating temperature to the peak temperature at a first ramp rate that averages about 100° C. per second or more, and, immediately...

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Bibliographische Detailangaben
Hauptverfasser: KOO TAE-HYOUNG, KIM HEESUNG, CHO KYOOCHUL, KIM TAESUNG, CHOI JOONYOUNG, KIM YEONSOOK, CHOI SAM-JONG
Format: Patent
Sprache:eng
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Zusammenfassung:A method of processing a semiconductor wafer includes preheating the wafer to a preheating temperature that is less than a peak temperature, heating the wafer from the preheating temperature to the peak temperature at a first ramp rate that averages about 100° C. per second or more, and, immediately after heating the wafer from the preheating temperature to the peak temperature, cooling the wafer at a second ramp rate that averages about −70° C. per second or more from the peak temperature to the preheating temperature, wherein the peak temperature is about 1,100° C. or more.