SEMICONDUCTOR DEVICE COMPRISING A DISTRIBUTED INTERCONNECTED SENSOR STRUCTURE FOR DIE INTERNAL MONITORING PURPOSES
In a semiconductor device, electrical measurement data may be obtained with enhanced spatial resolution, for instance from within the entire die region, by providing a distributed sensor structure, each of which may be individually accessed by an appropriate interconnect structure, while nevertheles...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In a semiconductor device, electrical measurement data may be obtained with enhanced spatial resolution, for instance from within the entire die region, by providing a distributed sensor structure, each of which may be individually accessed by an appropriate interconnect structure, while nevertheless maintaining the required number of terminals and test signals at a low level. |
---|