Spectral Measuring System

A spectral measuring system for determining substance properties using terahertz radiation comprises: one or more radiation sources of which at least one radiation source is adjustable or configurable with regard to its wavelength, wherein the first radiation source emits first radiation at a predet...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LUBKOLL DIETER, BOEGLI URS, BACHMANN PHILIPP
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	A spectral measuring system for determining substance properties using terahertz radiation comprises: one or more radiation sources of which at least one radiation source is adjustable or configurable with regard to its wavelength, wherein the first radiation source emits first radiation at a predetermined first wavelength; and is characterised by a sensor which responds to further radiation which is based on the radiation of the at least one radiation source; a control unit which is connected to the at least one radiation source and the sensor; wherein the control unit is configured to trigger at least one radiation source and to adjust the wavelength of the at least one adjustable radiation source as well as to read out the sensor.