PROXIMITY CORRECTION METHOD AND SYSTEM

A proximity correction method includes creating a first proximity correction model having a focus value and creating a second proximity correction model having a first defocus value. One of the first or second proximity correction models are associated with corresponding first and second layout area...

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1. Verfasser: GRIMM WOLFGANG
Format: Patent
Sprache:eng
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Zusammenfassung:A proximity correction method includes creating a first proximity correction model having a focus value and creating a second proximity correction model having a first defocus value. One of the first or second proximity correction models are associated with corresponding first and second layout areas of a semiconductor wafer.