Position measuring apparatus
A position measuring apparatus including a first irradiating part that irradiates a first beam to an object, a second irradiating part that irradiates a second beam to the object, a capturing part that captures images of the object, a processing part that generates a first difference image and a sec...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A position measuring apparatus including a first irradiating part that irradiates a first beam to an object, a second irradiating part that irradiates a second beam to the object, a capturing part that captures images of the object, a processing part that generates a first difference image and a second difference image by processing the images captured by the capturing part, an extracting part that extracts a contour and a feature point of the object from the first difference image, a calculating part that calculates three-dimensional coordinates of a reflection point located on the object based on the second difference image, and a determining part that determines a position of the object by matching the contour, the feature point, and the three-dimensional coordinates with respect to predetermined modeled data of the object. |
---|