SURFACE DEFORMATION DETECTION

A method of detecting deformation in a substrate includes detecting one or more changes in one or more emission characteristics of at least one pair of plasmon-coupled nanoparticles associated with a substrate, where the substrate includes at least one pair of plasmon-coupled nanoparticles. An appar...

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Bibliographische Detailangaben
Hauptverfasser:	KWON SUNGHOON, CHUNG SU EUN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method of detecting deformation in a substrate includes detecting one or more changes in one or more emission characteristics of at least one pair of plasmon-coupled nanoparticles associated with a substrate, where the substrate includes at least one pair of plasmon-coupled nanoparticles. An apparatus for deformation detection includes a detection unit for detecting one or more changes in one or more emission characteristics of at least one pair of plasmon-coupled nanoparticles associated with a substrate.