SAMPLING APPARATUS AND SAMPLING METHOD

Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that st...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KAWABATA MASAYUKI, KANOH EIJI, AKITA TAKAYUKI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.