SYSTEM, METHOD AND APPARATUS FOR ENHANCING RELIABILITY ON SCAN-INITIALIZED LATCHES AFFECTING FUNCTIONALITY
A system, method, and apparatus for enhancing reliability on scan-initialized latches that affect functionality in a digital design are provided. The system includes a group of latches that affect functionality in the digital design based on state values of the latches, where the latches are scan in...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A system, method, and apparatus for enhancing reliability on scan-initialized latches that affect functionality in a digital design are provided. The system includes a group of latches that affect functionality in the digital design based on state values of the latches, where the latches are scan initialized. The system also includes a disable allowance latch (DAL) allocated to the group of latches, where the DAL is a scan-initialized latch. The system further includes a gating function outputting the state value of at least one of the latches in the group to a functional block in the digital design in response to the DAL being in an enabled state and blocking the gating function output in response to the DAL being in a disabled state. |
---|