INTEGRITY CHECK METHOD APPLIED TO ELECTRONIC DEVICE, AND RELATED CIRCUIT

An integrity check method applied to an electronic device includes: fetching at least one portion of external data into a specific memory, where the external data is stored within the electronic device; during fetching the portion of the external data into the specific memory, checking whether the s...

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Bibliographische Detailangaben
Hauptverfasser: WU TSE-HONG, CHEN PING-SHENG, HSU CHIUN, CHAO MING-YANG, CHANG YAO-DUN
Format: Patent
Sprache:eng
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Zusammenfassung:An integrity check method applied to an electronic device includes: fetching at least one portion of external data into a specific memory, where the external data is stored within the electronic device; during fetching the portion of the external data into the specific memory, checking whether the size of the fetched data in the specific memory reaches a predetermined value, where the predetermined value is less than the total size of the external data; and when the size of the fetched data in the specific memory reaches the predetermined value, enabling an integrity check of the fetched data.