METHOD OF SPECIFYING A MONITORING CRITERION FOR A PARAMETER OF AN OBJECT IN AN OPERATIONAL MANAGEMENT SYSTEM

METHOD OF SPECIFYING A MONITORING CRITERION FOR A PARAMETER OF AN OBJECT IN AN OPERATIONAL MANAGEMENT SYSTEM

The invention relates to a method of specifying a monitoring criterion for a parameter of an object in an operational management system. The method in accordance with the invention comprises the step of assigning first information to the parameter, wherein the first information is associated with a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: GUTJAHR BERND
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:The invention relates to a method of specifying a monitoring criterion for a parameter of an object in an operational management system. The method in accordance with the invention comprises the step of assigning first information to the parameter, wherein the first information is associated with a first priority. In a further step, the first information is employed as monitoring criterion for the parameter if no further information associated with a priority higher than the first priority is assigned to the parameter.