SYSTEM FOR TESTING AT LEAST ONE ELECTRONIC CONTROL UNIT AND METHOD

The present invention relates to a test device (2) for testing and an associated method for operating the test device of at least one electronic control system (1). The test device exhibits an addressable physical memory. Moreover, the test device (2) is suitable and configured to be connected to the control system (1), which is to be tested, by means of a data channel. Furthermore, the test device is suitable and configured to calculate at least one environment model (21) and to execute at least one test model (22). The environment model (21) can interact by means of the data channel by outputting the environment model data to the control system (1) and by accepting the control system data from the control system (1). The test model (21) can be designed for influencing the environment model (22), for influencing the calculation of the environment model (22), and/or for influencing the electronic control system (1). The environment model (21) is described, inter alia, by the environment model variables, which are filed at fixed physical addresses in memory locations of the memory. The test device (2) is suitable and configured for modifying the environment model variables, and the test device (2) comprises a unit (23) for allocating, in which the allocation of all or a part of the environment model variable to the allocated physical addresses of the memory is filed so as to be readable.