MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

A measurement apparatus comprises a polarization controller (2) which controls polarization of light which is incident on a detection target; a wavefront dividing unit (5) which divides a wavefront of the light from the polarization controller (2); a polarizing unit (6, 7) which polarizes the light...

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1. Verfasser: OHSAKI YUMIKO
Format: Patent
Sprache:eng
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