SEMICONDUCTOR DEVICE

An I/O buffer section is provided with a status setting circuit. The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status set...

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Hauptverfasser:	KAWAKAMI FUMIKI, YADA NAOKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS PULSE TECHNIQUE
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creator	KAWAKAMI FUMIKI YADA NAOKI
description	An I/O buffer section is provided with a status setting circuit. The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status setting circuit even in the case of the I/O terminal originally set to a signal holding state. Consequently, a leak test for testing whether the I/O buffer section is good or bad, can be performed, and the reliability of a semiconductor device can be enhanced.
format	Patent
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Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status setting circuit even in the case of the I/O terminal originally set to a signal holding state. 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The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status setting circuit even in the case of the I/O terminal originally set to a signal holding state. Consequently, a leak test for testing whether the I/O buffer section is good or bad, can be performed, and the reliability of a semiconductor device can be enhanced.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><subject>PULSE TECHNIQUE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAJdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGBhbGBsamJhaOhsbEqQIA_RAfoA</recordid><startdate>20081211</startdate><enddate>20081211</enddate><creator>KAWAKAMI FUMIKI</creator><creator>YADA NAOKI</creator><scope>EVB</scope></search><sort><creationdate>20081211</creationdate><title>SEMICONDUCTOR DEVICE</title><author>KAWAKAMI FUMIKI ; YADA NAOKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008303548A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><topic>PULSE TECHNIQUE</topic><toplevel>online_resources</toplevel><creatorcontrib>KAWAKAMI FUMIKI</creatorcontrib><creatorcontrib>YADA NAOKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KAWAKAMI FUMIKI</au><au>YADA NAOKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR DEVICE</title><date>2008-12-11</date><risdate>2008</risdate><abstract>An I/O buffer section is provided with a status setting circuit. The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status setting circuit even in the case of the I/O terminal originally set to a signal holding state. Consequently, a leak test for testing whether the I/O buffer section is good or bad, can be performed, and the reliability of a semiconductor device can be enhanced.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS PULSE TECHNIQUE
title	SEMICONDUCTOR DEVICE
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