SEMICONDUCTOR DEVICE

An I/O buffer section is provided with a status setting circuit. The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status set...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KAWAKAMI FUMIKI, YADA NAOKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS PULSE TECHNIQUE
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Beschreibung
Zusammenfassung:	An I/O buffer section is provided with a status setting circuit. The status setting circuit arbitrarily sets a signal state of an I/O terminal according to a combination of control signals stored in a setting register. Thus, the I/O buffer section is temporarily set to a Hi-Z state by the status setting circuit even in the case of the I/O terminal originally set to a signal holding state. Consequently, a leak test for testing whether the I/O buffer section is good or bad, can be performed, and the reliability of a semiconductor device can be enhanced.