IC CHIP STRESS TESTING

IC CHIP STRESS TESTING

Methods, systems and program products are disclosed for performing a stress test of a line in an integrated circuit (IC) chip. One embodiment of the method includes: applying a constant current IS to the line; and stress testing the line while applying the constant current IS such that the constant...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SULLIVAN TIMOTHY D, LEE TOM C, POLCHLOPEK STANLEY W, STRONG ALVIN W, MERRILL TRAVIS S, AUBEL OLIVER, MASSEY DEBORAH M
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Methods, systems and program products are disclosed for performing a stress test of a line in an integrated circuit (IC) chip. One embodiment of the method includes: applying a constant current IS to the line; and stress testing the line while applying the constant current IS such that the constant current IS is not altered by a resistance change due to an onset of electromigration.