METHOD AND APPARATUS FOR CALIBRATING AN X-RAY DIAGNOSTIC SYSTEM

The subject matter of the present application relates to methods for calibrating an X-ray diagnostic system and apparatus for use in the calibration methods. In one embodiment, the apparatus includes a position detection system having an acquisition unit. An X-ray phantom is disposed near the acquis...

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Bibliographische Detailangaben
1. Verfasser:	DEHLER JUERGEN
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS DIAGNOSIS HUMAN NECESSITIES HYGIENE IDENTIFICATION MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The subject matter of the present application relates to methods for calibrating an X-ray diagnostic system and apparatus for use in the calibration methods. In one embodiment, the apparatus includes a position detection system having an acquisition unit. An X-ray phantom is disposed near the acquisition unit in a known position and/or orientation relative to a coordinate system of the position detection system. The X-ray phantom may be detachably mounted on the acquisition unit.