Apparatus for Hardening a Static Random Access Memory Cell from Single Event Upsets

Apparatus for Hardening a Static Random Access Memory Cell from Single Event Upsets

A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ROSS JASON, LAWSON DAVID C
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.