Semiconductor memory device for preventing supply of excess specific stress item and test method thereof

A semiconductor memory device includes a memory core which receives a specific stress item and a pattern item from an external source, a switch part which provides the power supplied from an external source and a switch control part which controls the switch part. The memory core responds to the specific stress item to be tested for stability, and the switch control part isolates the switch part if the specific stress item is supplied to the memory core two or more times.