Method of depositing copper using physical vapor deposition

The present method of forming an electronic structure includes providing a tantalum base layer and depositing a layer of copper on the tantalum layer, the deposition being undertaken by physical vapor deposition with the temperature of the base layer at 50° C. or less, with the deposition taking pla...

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Bibliographische Detailangaben
Hauptverfasser: ROBIE STEPHEN B, ROMERO JEREMIAS D, YU WEN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present method of forming an electronic structure includes providing a tantalum base layer and depositing a layer of copper on the tantalum layer, the deposition being undertaken by physical vapor deposition with the temperature of the base layer at 50° C. or less, with the deposition taking place at a power level of 300 W or less.