TEST SYSTEM FOR INTEGRATED CIRCUITS

A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by c...

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Bibliographische Detailangaben
Hauptverfasser: DEAN ALVAR A, VENTRONE SEBASTIAN T
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing Chips are disconnected from further testing and passing or failing chips are recorded.