MICROLOGISTICS TRACKING SYSTEM FOR AN AUTOMATED MANUFACTURING FACILITY

A computing system for monitoring activity in an automated fabrication facility includes a computer operably coupled to an MES database having data relating to manufacturing operation events; and the computer also being operably coupled to an AMHS database having data relating to movement of the wor...

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Bibliographische Detailangaben
Hauptverfasser:	GIFFORD JEFFREY P, LANGE NATHANIEL C, REYES RAY A, FLAHERTY PATRICK M, ANDERSON THOMAS E
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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Beschreibung
Zusammenfassung:	A computing system for monitoring activity in an automated fabrication facility includes a computer operably coupled to an MES database having data relating to manufacturing operation events; and the computer also being operably coupled to an AMHS database having data relating to movement of the work-in-process material lots between the manufacturing operations and the storage operations; and a solver product operatively installed on the computer for processing information regarding timing of the events and information regarding operation of the automated material handling system to generate a report regarding performance of the automated fabrication facility, wherein the report identifies information regarding a sequence of events having occurred in the manufacturing process.