PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING SAME

Disclosed is a probe card for imager devices, and methods of fabricating same. In one illustrative embodiment, a method of forming a probe card includes performing at least one etching process to define a plurality of light openings in a body of the probe card and forming a plurality of probe pins e...

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Bibliographische Detailangaben
Hauptverfasser:	CRUMP BRETT, CALDWELL JOHN, BYRD PHIL
Format:	Patent
Sprache:	eng
Schlagworte:	GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS LAYERED PRODUCTS LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PERFORMING OPERATIONS PHYSICS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	Disclosed is a probe card for imager devices, and methods of fabricating same. In one illustrative embodiment, a method of forming a probe card includes performing at least one etching process to define a plurality of light openings in a body of the probe card and forming a plurality of probe pins extending from the body. In another illustrative embodiment, a probe card that includes a body, at least one light opening formed in the body and at least one light conditioning device positioned within the at least one light opening is disclosed.