INTEGRATED CIRCUIT TEST RESULT COMMUNICATION

INTEGRATED CIRCUIT TEST RESULT COMMUNICATION

A chip has formed thereon integrated circuit elements, which include a main circuit and an associated non volatile memory structure. A test result associated with prior testing of a function of the main circuit is stored in the non volatile memory structure. Additional apparatus and methods are disc...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HORCH ANDREW E, KOEPP RONALD LEE, SEGURA CHRISTOPHER, MANLEY MICHAEL, ALLEN ERNEST, STOUGHTON ANTHONY, COLLINS ROBERT C
Format: Patent
Sprache:eng
Schlagworte:
ALARM SYSTEMS
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
ORDER TELEGRAPHS
PHYSICS
SELECTING
SIGNALLING
SIGNALLING OR CALLING SYSTEMS
TESTING
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Beschreibung
Zusammenfassung:A chip has formed thereon integrated circuit elements, which include a main circuit and an associated non volatile memory structure. A test result associated with prior testing of a function of the main circuit is stored in the non volatile memory structure. Additional apparatus and methods are disclosed.