METHOD AND SYSTEM FOR GENERATING LENGTH DEVIATION STATISTICS, AND METHOD AND SYSTEM FOR TUNING CONTROL PARAMETER OF OPTICAL STORAGE DEVICE USING THE SAME

A method for generating length deviation statistics utilized for controlling operation of an optical storage device, includes: detecting a plurality of pattern lengths, each pattern length corresponding to data on an optical storage medium accessed by the optical storage device; and performing calcu...

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1. Verfasser: YU CHIHING
Format: Patent
Sprache:eng
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Zusammenfassung:A method for generating length deviation statistics utilized for controlling operation of an optical storage device, includes: detecting a plurality of pattern lengths, each pattern length corresponding to data on an optical storage medium accessed by the optical storage device; and performing calculations according to the pattern lengths to generate length deviation statistics associated with the pattern lengths.