Calibration method and apparatus for pixilated solid state detector

A system calibrates a solid state detector ( 20 ) for a radiation imaging device (10) in a single acquisition. A calibration phantom ( 40 ) emits radiation concurrently at at least first and second characteristic energy levels. A nuclear camera ( 16 ) generates associated sets of radiation data span...

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Bibliographische Detailangaben
Hauptverfasser:	PETRILLO MICHAEL J, YE JINGHAN
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR INSTRUMENT DETAILS MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A system calibrates a solid state detector ( 20 ) for a radiation imaging device (10) in a single acquisition. A calibration phantom ( 40 ) emits radiation concurrently at at least first and second characteristic energy levels. A nuclear camera ( 16 ) generates associated sets of radiation data spanning both the first and second energy levels from the emitted radiation that is received by solid state detector ( 20 ). A means ( 64 ) determines associated centers of energy peaks and energy values of the generated data sets. A calibration means ( 80 ) calibrates at least one of gain, offset, performance and dead pixel correction based on the determined centers and peaks of the acquired data sets.