Absolute position measurement system and method of producing material measure for the same

Absolute position measurement system and method of producing material measure for the same

A position measurement system has a material measure provided with incremental and absolute markings, and a scanner movable relative to the markings, wherein the incremental markings are formed by periodically located recesses on the material measure, and the absolute marking are located between the...

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1. Verfasser: REUSING GUENTER
Format: Patent
Sprache:eng
Schlagworte:
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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creator REUSING GUENTER
description A position measurement system has a material measure provided with incremental and absolute markings, and a scanner movable relative to the markings, wherein the incremental markings are formed by periodically located recesses on the material measure, and the absolute marking are located between the recesses of the material measure.
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title Absolute position measurement system and method of producing material measure for the same
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