Absolute position measurement system and method of producing material measure for the same

A position measurement system has a material measure provided with incremental and absolute markings, and a scanner movable relative to the markings, wherein the incremental markings are formed by periodically located recesses on the material measure, and the absolute marking are located between the...

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Bibliographische Detailangaben
1. Verfasser:	REUSING GUENTER
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A position measurement system has a material measure provided with incremental and absolute markings, and a scanner movable relative to the markings, wherein the incremental markings are formed by periodically located recesses on the material measure, and the absolute marking are located between the recesses of the material measure.