Method to obtain fully silicided gate electrodes

The present invention provides a method of fabricating a microelectronics device. In one aspect, the method comprises depositing a protective layer ( 510 ) over a spacer material ( 415 ) located over gate electrodes ( 250 ) and a doped region ( 255 ) located between the gate electrodes ( 250 ), remo...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MEHRAD FREIDOON, VITALE STEVEN A, HONG HYESOOK
Format: Patent
Sprache:eng
Schlagworte:
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