Method for marking defect and device therefor

A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the pres...

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Hauptverfasser: SUYAMA TSUNEO, KAZAMA AKIRA, YOSHIKAWA SHOJI, UESUGI MITSUAKI, KUSHIDA YASUO, KAWAMURA TSUTOMU, HARADA SHUICHI, UEHARA OSAMU, KANETO SHUJI, IWABUCHI MASAHIRO, TOMONAGA SHINICHI, OSHIGE TAKAHIKO, TANAKA HAJIME, HARADA KOZO, SUGIURA HIROYUKI, INOMATA MASAICHI, FUKUDA SHIGEMI
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creator SUYAMA TSUNEO
KAZAMA AKIRA
YOSHIKAWA SHOJI
UESUGI MITSUAKI
KUSHIDA YASUO
KAWAMURA TSUTOMU
HARADA SHUICHI
UEHARA OSAMU
KANETO SHUJI
IWABUCHI MASAHIRO
TOMONAGA SHINICHI
OSHIGE TAKAHIKO
TANAKA HAJIME
HARADA KOZO
SUGIURA HIROYUKI
INOMATA MASAICHI
FUKUDA SHIGEMI
description A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
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language eng
recordid cdi_epo_espacenet_US2007052964A1
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subjects AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKINGWITHOUT ESSENTIALLY REMOVING MATERIAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES,OTHERWISE THAN BY ROLLING
MEASURING
MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVINGMATERIAL
PERFORMING OPERATIONS
PHYSICS
PUNCHING METAL
TESTING
TRANSPORTING
title Method for marking defect and device therefor
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