Method for marking defect and device therefor

A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the pres...

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Bibliographische Detailangaben
Hauptverfasser:	SUYAMA TSUNEO, KAZAMA AKIRA, YOSHIKAWA SHOJI, UESUGI MITSUAKI, KUSHIDA YASUO, KAWAMURA TSUTOMU, HARADA SHUICHI, UEHARA OSAMU, KANETO SHUJI, IWABUCHI MASAHIRO, TOMONAGA SHINICHI, OSHIGE TAKAHIKO, TANAKA HAJIME, HARADA KOZO, SUGIURA HIROYUKI, INOMATA MASAICHI, FUKUDA SHIGEMI
Format:	Patent
Sprache:	eng
Schlagworte:	AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKINGWITHOUT ESSENTIALLY REMOVING MATERIAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES,OTHERWISE THAN BY ROLLING MEASURING MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVINGMATERIAL PERFORMING OPERATIONS PHYSICS PUNCHING METAL TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.