Methods and systems for positioning sample containing assemblies in an optical device

Method and system for positioning an assembly in an optical device.

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Bibliographische Detailangaben
Hauptverfasser:	TSAI GEORGE P, KRALIK JOHN C
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Method and system for positioning an assembly in an optical device.