Alignment method and apparatus for pixilated detector

A detector ( 20 ) for a nuclear imaging system ( 10 ) includes a plurality of sockets ( 44 ) which each support an array of individual detector elements ( 48 ). Each socket ( 44 ) includes a plurality of electrical connectors ( 54 ) and socket alignment structures ( 72 ). The sockets ( 44 ), carryin...

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Hauptverfasser:	PETRILLO MICHEAL J, NAIMA HAMID, TSENG SANYI, VESSEL JOHN F, CORA SORIN V
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	A detector ( 20 ) for a nuclear imaging system ( 10 ) includes a plurality of sockets ( 44 ) which each support an array of individual detector elements ( 48 ). Each socket ( 44 ) includes a plurality of electrical connectors ( 54 ) and socket alignment structures ( 72 ). The sockets ( 44 ), carrying the detector elements ( 48 ), are installed onto a circuit board ( 40 ). The circuit board ( 40 ) includes a plurality of electrical conductive openings ( 52 ) which electrically connect with the electrical connectors ( 54 ) and alignment structures ( 74 ) which mate with the socket alignment structures ( 72 ) to align the sockets ( 44 ) and the individual detector elements ( 48 ) to the circuit board ( 40 ). A collimator ( 24 ) is mounted and aligned to a frame ( 60 ). The frame ( 60 ) and the circuit board ( 40 ) each include aligning structures to align the collimator ( 24 ) to the circuit board ( 40 ) and the individual detector elements ( 48 ).