Analyzing chamber including a leakage ion beam detector and mass analyzer including the same

In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a pat...

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Bibliographische Detailangaben
Hauptverfasser: EARM HYUN-SUB, LEE SEUNG-SE, KANG GON-SU, AN SUNG-YEUL, KIM YOUNG-DAE
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:In an analyzing chamber for a mass analyzer, a body of the analyzing chamber may include an inlet through which an ion beam enters and an outlet through which the ion beam leaves. A shielding section may be installed on a sidewall. The shielding section may prevent the ion beam traveling along a path in the body from causing damage to the sidewall of the body. A detector may be interposed between the sidewall of the body and the shielding section. The detector may detect an ion beam leaking through the shielding section. Accordingly, damage to the sidewall of the body may be sufficiently reduced and/or prevented.